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Updated: May 3, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
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Research on the method for measuring the focal spot size of micro-focus X-ray sources using the JIMA resolution test

Li Fengxiao1,2, Wang Yixin1,2, Xu Haodong1,2

  • 1Key Laboratory of Optoelectronic Technology and Systems of the Ministry of Education, ICT Research Center, Chongqing University, Chongqing 400044, China.

Journal of X-Ray Science and Technology
|January 13, 2026
PubMed

Keywords:
Monte Carlo methodbeam equivalent widthfocal spot sizeresolution test card

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