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Spectral division multiplexing-based region projection for 3D measurement under mutual reflection.

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    This study introduces a novel spectral division multiplexing-based region projection (SRP) technique for 3D shape measurement. The method effectively eliminates interreflection artifacts, enabling high-precision measurement of multiple objects with varied reflective properties.

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    Area of Science:

    • Optics and Photonics
    • 3D Metrology
    • Computer Vision

    Background:

    • Structured-light techniques are advanced methods for 3D shape measurement.
    • Mutual reflection interference between objects with diverse reflective properties poses a significant challenge.
    • Existing methods struggle to accurately measure multiple objects simultaneously due to these interreflection artifacts.

    Purpose of the Study:

    • To propose and validate a novel technique for high-precision 3D shape measurement of multiple objects.
    • To fundamentally eliminate indirect reflection artifacts caused by mutual reflections.
    • To overcome the limitations of current structured-light techniques in scenarios with complex reflective surfaces.

    Main Methods:

    • Development of a spectral division multiplexing-based region projection (SRP) technique.
    • Encoding different surfaces with structured light of distinct spectra for spectral domain isolation.
    • Utilizing hetero-spectral division multiplexing to assign unique spectral information to different sub-regions within a single frame.
    • Implementing spectral channel separation for independent phase retrieval.

    Main Results:

    • Successfully isolated mutual reflection in the spectral domain, eliminating indirect reflection artifacts.
    • Achieved independent phase retrieval for each measured object through spectral channel separation.
    • Demonstrated complete high-precision 3D measurement free from interreflection artifacts.
    • Experimental validation confirmed the feasibility and effectiveness of the SRP technique.

    Conclusions:

    • The proposed SRP technique offers a robust solution for 3D shape measurement of multiple objects with diverse reflective properties.
    • Spectral encoding and separation effectively mitigate interreflection interference, leading to artifact-free measurements.
    • This advancement enables more accurate and reliable 3D metrology in complex environments.