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Few-shot cross-episode adaptive memory for metal surface defect semantic segmentation.
Jiyan Zhang1, Hanze Ding1, Ming Peng1
1College of Mathematics and Information Engineering, Longyan University, Longyan, 364012, China.
This study introduces an episode-adaptive memory network (EAMNet) for metal surface defect detection. EAMNet improves few-shot semantic segmentation by adapting to subtle training variations, enhancing defect region analysis and segmentation accuracy.
Area of Science:
- Computer Vision
- Machine Learning
- Materials Science
Background:
- Few-shot semantic segmentation is crucial for metal surface defect detection with limited data.
- Existing methods struggle with adaptability and segmentation granularity in few-shot scenarios.
Purpose of the Study:
- To propose an episode-adaptive memory network (EAMNet) for improved few-shot semantic segmentation in metal surface defect detection.
- To address limitations in semantic description and segmentation granularity of previous methods.
Main Methods:
- Developed an episode-adaptive memory unit (EAMU) using an adaptive factor for cross-episode semantic dependency modeling.
- Introduced a context adaptation module (CAM) for fine-grained segmentation by aggregating hierarchical features.
- Proposed global response mask average pooling (GRMAP) for direct fine-grained cue extraction.
- Implemented attention distillation (AD) to stabilize cross-episode adaptation.
Main Results:
- EAMNet demonstrated superior performance in few-shot semantic segmentation for metal surface defects.
- The proposed methods achieved state-of-the-art results on the Surface Defect-[Formula: see text] and FSSD-12 datasets.
- Significant improvements in adaptability and segmentation granularity were observed.
Conclusions:
- EAMNet effectively handles subtle variations across training episodes in few-shot learning.
- The proposed approach enhances the accuracy and granularity of metal surface defect segmentation.
- This work sets a new benchmark for few-shot semantic segmentation in industrial defect detection.
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