White light interferometry analysis for measuring thin film thickness down to a few nanometers
Victor Ziapkoff1, François Boulogne2, Anniina Salonen3
1Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, Orsay, 91405, France. victor.ziapkoff@universite-paris-saclay.fr.
A new white-light interferometry method with the optifik Python library allows precise nanometer-scale foam film thickness measurements. This technique is adaptable for various thin, non-opaque layers, overcoming spectral limitations.
Area of Science:
- Physics
- Materials Science
- Surface Science
Background:
- Accurate measurement of thin films, especially foam films, is crucial for understanding material properties and processes.
- Existing methods for thin film thickness measurement often have limitations in resolution, applicability, or automation.
Purpose of the Study:
- To introduce a practical white-light interferometric method for automated thin film thickness deduction.
- To develop and validate an open-source Python library (optifik) for spectrum-to-thickness analysis.
- To demonstrate the method's capability for measurements down to a few nanometers and its application in dynamic foam film studies.
Main Methods:
- Utilizing white-light interferometry to analyze the spectral reflectance of thin films.
- Developing an open-source Python library, optifik, for automated processing of spectral data to determine film thickness.
- Analyzing various spectral scenarios, including those with numerous fringes, moderate peaks, and limited features.
- Investigating limitations such as spectral range, refractive index dependency, and signal quality.
Main Results:
- Successful demonstration of foam film thickness measurements down to a few nanometers.
- Validation of the optifik library for automated and accurate spectrum-to-thickness deduction.
- Illustrative examples provided for different spectral characteristics encountered during analysis.
- Identification and discussion of key limitations affecting measurement accuracy.
Conclusions:
- The presented white-light interferometric method, powered by the optifik Python library, offers a practical and automated approach for precise thin film thickness measurements.
- The technique is versatile and can be applied to various non-opaque layers, with demonstrated utility in dynamic studies of foam films.
- Understanding the method's limitations is essential for optimal application and data interpretation.
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