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Predicting and classifying deoxynivalenol in wheat flour using ATR-FTIR spectroscopy and explainable machine learning
Jiajun Liu1, Kebing Yao2, Chen Chen2
1Zhenjiang Academy of Agricultural Sciences/ Zhenjiang Agricultural Science Research Institute of Jiangsu Hilly Regions, Jiangsu Academy of Agricultural Sciences, Jurong, China; International Maize and Wheat Improvement Center (CIMMYT), Texcoco, Mexico.
Fourier-transform infrared spectroscopy (FTIR) combined with machine learning accurately predicts Deoxynivalenol (DON) in wheat. This cost-effective method enhances food safety by enabling reliable DON level monitoring.
Area of Science:
- Agricultural Chemistry
- Analytical Chemistry
- Food Science
Background:
- Deoxynivalenol (DON) is a significant mycotoxin contaminant in wheat, posing risks to food safety.
- Current methods for DON quantification lack reliability and cost-effectiveness.
- Fusarium head blight is a primary cause of DON contamination in wheat kernels.
Purpose of the Study:
- To develop and validate a cost-effective method for predicting DON concentrations in wheat using ATR-FTIR spectroscopy.
- To compare the performance of four machine learning models for DON quantification and classification.
- To enhance the interpretability of the predictive models using SHAP analysis.
Main Methods:
- Fourier-transform infrared spectroscopy with attenuated total reflectance (ATR-FTIR) was employed for spectral data acquisition.
- Four machine learning models (XGBoost, RF, TabPFN, CatBoost) were trained on spectral features selected via RFE.
- SHapley Additive exPlanations (SHAP) were utilized for model interpretability.
Main Results:
- The TabPFN model achieved the highest quantitative prediction accuracy (R² = 0.86).
- SHAP analysis identified key wavenumbers influencing DON prediction: 996, 1083, 1135, and 1574 cm⁻¹.
- For binary classification of DON levels, the CatBoost model demonstrated superior performance (Recall=0.91, Accuracy=0.88, F2=0.91).
Conclusions:
- Machine learning analysis of FTIR spectra offers an effective approach for DON detection in wheat.
- The proposed ATR-FTIR and ML methodology provides a feasible solution for monitoring DON levels in wheat flour.
- This approach has potential applications in both laboratory and industrial settings for ensuring food safety.
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