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Updated: Feb 8, 2026

Niobium Oxide Films Deposited by Reactive Sputtering: Effect of Oxygen Flow Rate
Published on: September 28, 2019
Sputter-Deposited Ruthenium Nitrides for Electrochemical Nitrogen Fixation to Ammonia under Ambient Conditions
Xin Wei1, Ruicheng Feng1, Sa'id Albarqawi1
1Institute of Inorganic Chemistry (IAC), RWTH Aachen University,Landoltweg 1a, Aachen 52074, Germany.
None:
Electrochemical nitrogen reduction reaction (eNRR) under ambient conditions offers a promising route for ammonia synthesis, although it currently suffers from slow kinetics and competing hydrogen evolution. Transition metal nitrides (TMNs) enable efficient nitrogen activation via the Mars-van Krevelen mechanism; however, effectively suppressing nitrogen leaching under electrochemical conditions remains challenging. Here, we report a nanostructured ruthenium nitride (RuN) catalyst synthesized via magnetron sputtering, demonstrating its application for eNRR for the first time. Structural characterization confirms a zincblende-like RuN phase, while surface properties (i.e., roughness and wettability) are tuned by the deposition duration. The optimal catalyst achieved an ammonia yield of 3.0 × 10-10 mol cm-2 s-1 at -0.3 V vs RHE and a Faradaic efficiency of 6.1% at -0.1 V vs RHE in a 0.1 mol L-1 KOH electrolyte, surpassing most reported ambient TMN catalysts. These findings underscore the promise of metal nitride-based electrocatalysts and provide insights into the rational design of next-generation catalysts for sustainable nitrogen fixation.
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