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Light Helicity as a Probe for Thickness-Controlled Topological States in α-Sn/CdTe(110) Heterostructures
Tengfei Liu1, Xiyu Hong2, Zhe Li3
1Institute of Micro/Nano Devices and Solar Cells, School of Physics and Information Engineering, Fuzhou University, Fuzhou 350108, China.
We discovered a thickness-driven topological phase transition in alpha-tin (α-Sn) thin films. Helicity-dependent photocurrent measurements reveal a shift from 2D to 3D topological insulator states between 5 and 10 nm thickness.
Area of Science:
- Condensed Matter Physics
- Materials Science
- Topological Materials
Background:
- Alpha-tin (α-Sn) possesses a complex topological phase diagram.
- Experimental methods for manipulating and identifying α-Sn phases in the (110) orientation are limited.
Purpose of the Study:
- To investigate the epitaxial growth of α-Sn thin films on CdTe(110) substrates.
- To explore the thickness-dependent topological properties of α-Sn films using helicity-dependent photocurrent (HDPC).
Main Methods:
- Epitaxial growth of α-Sn films via molecular beam epitaxy (MBE).
- Characterization using RHEED, Raman spectroscopy, XRD, and HR-TEM.
- Helicity-dependent photocurrent (HDPC) measurements under varying film thicknesses and illumination conditions.
Main Results:
- HDPC measurements showed distinct angular dependencies for 5 nm (odd) versus 10 and 30 nm (even) films.
- Contributions of circular photogalvanic effect (CPGE) and circular photon drag effect (CPDE) were identified.
- A thickness-driven topological phase transition from 2D to 3D topological insulator was observed between 5 and 10 nm.
Conclusions:
- HDPC serves as a sensitive tool for diagnosing topological phase transitions in α-Sn films.
- The observed transition is driven by quantum tunneling, quantum confinement, and compressive strain.
- α-Sn(110) films offer a tunable platform for exploring topological phenomena and developing spintronic devices.
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