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Facile optimization of combinatorial sputtering processes with arbitrary numbers of components for targeted
Shelby Sutton Fields1, Christopher David White1, Keith E Knipling1
1Materials Science and Technology Division, U.S. Naval Research Laboratory, Washington, District of Columbia 20375, USA.
This study presents a new method for optimizing combinatorial sputtering, enabling precise control over thin film composition. The technique facilitates the high-throughput synthesis of alloy thin films with desired stoichiometries for various applications.
Area of Science:
- Materials Science
- Thin Film Deposition
- Physical Vapor Deposition
Background:
- Combinatorial sputtering allows high-throughput synthesis of compositionally varied thin films.
- Mapping stoichiometry effects on properties requires precise control over film composition.
- Optimizing sputter power for multiple components is complex and often iterative.
Purpose of the Study:
- To introduce a novel composition optimization procedure for sputtered combinatorial films.
- To enable facile synthesis of thin films with targeted compositions.
- To overcome the limitations of guess-and-check methods in combinatorial sputtering.
Main Methods:
- Leveraging wavelength dispersive x-ray fluorescence for rapid composition mapping.
- Developing a procedure to optimize sputter power for arbitrary numbers of components.
- Demonstrating the method by sputtering a combinatorial CrvFewMoxNbyTaz film.
Main Results:
- Successful implementation of a composition optimization procedure.
- Facile synthesis of sputtered combinatorial films with targeted compositions.
- Demonstrated capability for optimizing processing for multiple components.
Conclusions:
- The developed procedure simplifies the synthesis of combinatorial films with specific stoichiometries.
- This method enhances the high-throughput advantages of combinatorial sputtering.
- Enables precise control over alloy thin film composition for property mapping.
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