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Updated: Feb 13, 2026

Observation and Analysis of Blinking Surface-enhanced Raman Scattering
Published on: January 11, 2018
Aluminum-Induced Surface-Enhanced Raman Scattering in Ti-Al-Ti Sandwich Multilayer Thin Films
Luping Wu1, Tingzhen Yan1,2, Ruijin Hong1
1Engineering Research Center of Optical Instrument and System, Ministry of Education and Shanghai Key Lab of Modern Optical System, University of Shanghai for Science and Technology, No. 516 Jungong Road, Shanghai 200093, China.
Abstract:
A series of Ti-Al-Ti sandwich thin films with different Al layer thicknesses was prepared via magnetron sputtering. The Al layer facilitated Ti-Al metal coupling within the films, which significantly strengthened the localized surface plasmon resonance (LSPR) and obtained more "hot-spots", ultimately leading to a remarkable enhancement of the localized electric field. The LSPR effectively promoted charge transfer between probe molecules and the Ti-Al-Ti sandwich thin film. Raman scattering intensity was jointly governed by chemical and electromagnetic enhancement mechanisms. When used as a surface-enhanced Raman scattering (SERS) substrate for methylene blue (MB) detection, the sandwich-structured films achieved a Raman enhancement factor of 3.27 × 106, approximately twice that of single-layer silver thin films. The substrate exhibited a low MB detection limit for MB of 10-8 M and excellent stability. Additionally, the relative standard deviation of main characteristic peak intensities across different positions is consistently below 6%, indicating superior uniformity and reproducibility. Experimental results are in good agreement with FDTD simulation outcomes.
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