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Leveraging transfer learning for accurate estimation of ionic migration barriers in solids
Reshma Devi1, Keith T Butler2, Gopalakrishnan Sai Gautam1
1Department of Materials Engineering, Indian Institute of Science, Bengaluru, Karnataka India.
We developed a graph neural network model to accurately predict ionic migration barriers (Em) in materials for batteries and sensors. This transfer learning approach significantly improves predictions compared to existing methods.
Area of Science:
- Materials Science
- Computational Chemistry
- Machine Learning
Background:
- Ionic migration barrier (Em) is critical for applications like batteries, fuel cells, and sensors.
- Accurate estimation of Em is challenging, with previous methods relying on imprecise descriptors.
- Developing predictive models for Em is essential for accelerating materials discovery.
Purpose of the Study:
- To develop an efficient and accurate method for predicting the ionic migration barrier (Em) in diverse materials.
- To leverage transfer learning and graph neural networks for improved Em prediction.
- To establish a benchmark for machine learning models in predicting materials properties.
Main Methods:
- Utilized a graph neural network architecture with transfer learning principles.
- Pre-trained a model (MPT) on seven bulk properties and fine-tuned it on a dataset of 619 Em values.
- Incorporated architectural modifications to account for migration pathways and improve inductive bias.
Main Results:
- The best-performing fine-tuned model (MODEL-3) achieved a R² score of 0.703 ± 0.109 and MAE of 0.261 ± 0.034 eV on the test set.
- Demonstrated superior accuracy compared to classical machine learning, graph models trained from scratch, and machine learned interatomic potentials.
- Achieved 80% accuracy in classifying materials as 'good' ionic conductors.
Conclusions:
- Transfer learning strategies and MPT architectural modifications are effective for predicting Em.
- The developed model offers a significant advancement in accurately predicting ionic migration barriers.
- This approach can be extended to predict other data-scarce material properties.
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