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Updated: Feb 20, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Two-axis goniometer facility for x-ray characterization of diffractors
1United Kingdom Atomic Energy Authority, Culham Campus, Abingdon, Oxfordshire OX14 3DB, United Kingdom.
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A detailed description of a two-axis goniometer paired with an x-ray source is provided, encompassing measurements of double-crystal integrated reflectivity for diffractors employed in JET spectrometers. Polarization adjustments to these measurements are computed to estimate single-crystal integrated reflectivity. Synchronized parallel and dispersive diffractor motion profiles at this facility exhibit favorable angular error distributions, engaging all motors with deviations of ∼2 arcsec across the full range of accessible Bragg angles (0°-86°).
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