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Updated: Feb 20, 2026

$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Two-axis goniometer facility for x-ray characterization of diffractors.

¹United Kingdom Atomic Energy Authority, Culham Campus, Abingdon, Oxfordshire OX14 3DB, United Kingdom.

The Review of Scientific Instruments

|February 18, 2026

Summary

This summary is machine-generated.

This study details a two-axis goniometer and X-ray source for measuring crystal reflectivity in JET spectrometers. The system achieves high precision, with motor deviations around 2 arcseconds across all Bragg angles.

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Area of Science:

Physics
Materials Science

Background:

Accurate measurement of crystal reflectivity is crucial for spectrometer performance.
Existing methods may lack precision or versatility for advanced applications.

Purpose of the Study:

To describe a novel two-axis goniometer system for X-ray diffraction measurements.
To evaluate the system's precision and applicability for JET spectrometers.

Main Methods:

Utilized a two-axis goniometer coupled with an X-ray source.
Measured double-crystal integrated reflectivity and computed single-crystal values.
Analyzed synchronized diffractor motion profiles and angular errors.

Main Results:

The goniometer system demonstrated high precision with angular errors of approximately 2 arcseconds.
Favorable angular error distributions were observed across the full range of Bragg angles (0°-86°).
Polarization adjustments enabled accurate estimation of single-crystal integrated reflectivity.

Conclusions:

The described goniometer system is suitable for precise reflectivity measurements in spectrometer applications.
The system's accuracy and wide angular range make it valuable for materials analysis and instrument calibration.