Strained 2D Semiconductor Lateral Heterojunctions via Grayscale Thermal-Scanning Probe Lithography

Giorgio Zambito1, Giulio Ferrando1, Matteo Barelli1

  • 1Dipartimento di Fisica Università di Genova Via Dodecaneso 33 16146 Genova Italy.

Small Science
|February 20, 2026
PubMed
Summary

Novel strain engineering of 2D transition metal dichalcogenides (TMD) semiconductor layers using grayscale thermal-Scanning Probe Lithography (t-SPL) enables nanoscale control over optoelectronic properties. This method fabricates strained MoS2-Au heterojunctions with tunable electronic responses for advanced nanoelectronic and nanophotonic applications.