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Daniel Sier1, Jay D Bourke2, Christopher T Chantler2
1L'Orme des Merisiers, Synchrotron SOLEIL, Départmental 128, Saint-Aubin 91190, France.
This study introduces a novel method for measuring electron inelastic mean free path (IMFP) in copper using X-ray absorption fine structure (XAFS). The findings highlight discrepancies in current IMFP data, impacting XAFS analysis accuracy.
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