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Updated: Feb 26, 2026

Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry
Published on: May 6, 2019
High-Resolution Microscope-Mode Secondary Ion Mass Spectrometry Imaging
Yifeng Jia1, Maria Elena Castellani1,2, Kieran Cheung1
1The Department of Chemistry, The Chemistry Research Laboratory, The University of Oxford, 12 Mansfield Road, Oxford OX1 3TA, United Kingdom.
A new secondary ion mass spectrometry (SIMS) instrument offers high-throughput imaging. This advanced microscope provides high mass and spatial resolution for analyzing biological samples like mouse brain tissue.
Area of Science:
- Analytical Chemistry
- Biophysics
- Materials Science
Background:
- Secondary Ion Mass Spectrometry (SIMS) is a powerful surface analysis technique.
- High-throughput imaging capabilities are crucial for analyzing large biological samples.
- Existing SIMS instruments may have limitations in speed or resolution.
Purpose of the Study:
- To develop a novel SIMS microscope-mode imaging instrument.
- To achieve high throughput, mass resolution, and spatial resolution.
- To demonstrate the instrument's utility in biological tissue analysis.
Main Methods:
- Coupling time-of-flight mass spectrometry with pulsed ion extraction.
- Utilizing an ion imaging detector with a fast scintillator screen.
- Optimizing instrument parameters for mass and spatial resolution.
Main Results:
- Achieved mass resolutions of m/Δm ∼ 2000 (up to ∼6900 with detector improvements).
- Obtained spatial resolutions better than 5 μm.
- Successfully imaged atomic and molecular ion species in mouse brain tissue within minutes.
Conclusions:
- The developed SIMS instrument enables rapid, high-resolution imaging of biological samples.
- It is suitable for a wide range of applications requiring high throughput.
- Demonstrates potential for analyzing biologically relevant ions in complex tissues.
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