High-Resolution Mass Spectrometry (HRMS)
Super-resolution Fluorescence Microscopy
Overview of Microscopy Techniques
Mass Spectrum: Interpretation
Overview of Electron Microscopy
Mass Analyzers: Overview
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Updated: Feb 26, 2026

Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry
Published on: May 6, 2019
Yifeng Jia1, Maria Elena Castellani1,2, Kieran Cheung1
1The Department of Chemistry, The Chemistry Research Laboratory, The University of Oxford, 12 Mansfield Road, Oxford OX1 3TA, United Kingdom.
A new secondary ion mass spectrometry (SIMS) instrument offers high-throughput imaging. This advanced microscope provides high mass and spatial resolution for analyzing biological samples like mouse brain tissue.
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