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Speckle-based X-ray microtomography via preconditioned Wirtinger flow.

KyeoReh Lee^1,2,3, Herve Hugonnet^4,5, Jae-Hong Lim⁶

¹Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon, 34141, Republic of Korea. lee.kyeo@gmail.com.

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Summary

We developed preconditioned Wirtinger flow (PWF) for assumption-free, single-shot quantitative X-ray microtomography. This method enhances accuracy and resolution for imaging low atomic number materials, even with bench-top sources.

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Area of Science:

Medical Imaging
Materials Science
Physics

Background:

Quantitative phase imaging in X-ray microtomography enhances sensitivity for low atomic number materials.
Current methods often require extra measurements or assumptions, limiting practical use.

Purpose of the Study:

To introduce preconditioned Wirtinger flow (PWF) for assumption-free, single-shot quantitative X-ray microtomography.
To enable accurate phase retrieval with a single X-ray scan, improving applicability.

Main Methods:

Developed a specialized gradient-based algorithm incorporating an accurate physical model.
Accounted for partial coherence of the X-ray source.
Utilized preconditioned Wirtinger flow (PWF) for phase retrieval.

Main Results:

Demonstrated accurate phase retrieval in a single shot.
Achieved improved accuracy and spatial resolution compared to conventional speckle tracking.
Showcased robustness and versatility across various samples.

Conclusions:

PWF offers a practical solution for quantitative X-ray microtomography without prior assumptions.
The method is compatible with bench-top sources due to partial coherence consideration.
PWF significantly advances the field for imaging low atomic number materials.