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Nanofabrication of Gate-defined GaAs/AlGaAs Lateral Quantum Dots
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Low-Threshold Lasing in Colloidal InP/ZnSe/ZnS Quantum Dots via ZnSe Interlayer Engineering
Kaien Chong1, Yi Yang1, Xiaoqing Zhou2
1Key Zhejiang Key Laboratory of 3D Micro/Nano Fabrication and Characterization, Department of Electronic and Information Engineering, School of Engineering, Westlake University, Hangzhou, Zhejiang 310030, China.
We demonstrate lasing in red-emitting indium phosphide (InP) quantum dots (QDs) for display applications. Optimizing the shell thickness is crucial to minimize defects and achieve efficient light amplification for laser applications.
Area of Science:
- Materials Science
- Optoelectronics
- Nanotechnology
Background:
- Colloidal indium phosphide (InP) quantum dots (QDs) are heavy-metal-free alternatives for display technologies.
- Their potential for light amplification and use in lasers remains largely unexplored.
Purpose of the Study:
- To investigate light amplification and lasing in InP/ZnSe/ZnS core/multishell quantum dots.
- To understand the role of shell thickness and defect states on optical gain properties.
Main Methods:
- Fabrication of InP/ZnSe/ZnS core/multishell quantum dots with varying ZnSe interlayer thickness.
- Characterization using time-resolved spectroscopy to analyze carrier dynamics and Auger losses.
- Construction and testing of a liquid-state vertical-cavity surface-emitting laser (VCSEL).
Main Results:
- Achieved lasing in red-emitting InP QDs with high quantum yield.
- Demonstrated that optimal ZnSe interlayer thickness reduces amplified spontaneous emission thresholds.
- Identified defect states capturing hot carriers as a factor increasing losses and hindering population inversion.
- Observed lasing thresholds of 334 μJ/cm2 (femtosecond) and 4.3 mJ/cm2 (nanosecond) in the VCSEL.
Conclusions:
- InP-based QDs show significant potential as optical gain media for laser applications.
- Minimizing defects that capture hot carriers is essential for improving the lasing performance of InP QDs.
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