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Related Concept Videos

X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

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X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
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X-ray Crystallography

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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
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Determination of Crystal Structures

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In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
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Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

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The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Related Experiment Video

Updated: Feb 28, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Energy-Dispersive X-Ray Diffraction: Principles, Instrumentation and Emerging Applications.

Zhimao Wang1, Gang Li1, Jie Zhang1

  • 1Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China.

Materials (Basel, Switzerland)
|February 27, 2026
PubMed
Summary

Energy-Dispersive X-ray Diffraction (EDXRD) uses a white X-ray beam for rapid data collection without angle scanning. This technique is ideal for time-resolved and operando studies in materials science.

Keywords:
detectors technologyenergy-dispersive X-ray diffraction (EDXRD)materials characterizationoperando spectroscopysynchrotron radiation

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Analytical Chemistry

Background:

  • Energy-Dispersive X-ray Diffraction (EDXRD) utilizes a polychromatic X-ray beam and energy-discriminating detector.
  • It measures diffracted intensity versus photon energy at a fixed scattering geometry.
  • This method bypasses the need for mechanical scanning of the scattering angle.

Purpose of the Study:

  • To provide a comprehensive review of EDXRD.
  • To cover fundamental principles, experimental methods, and data analysis.
  • To highlight applications in high-pressure science and battery research.

Main Methods:

  • Review of EDXRD principles and physics.
  • Comparison of synchrotron white-beam and monochromatic X-ray diffraction.
  • Discussion of detector strategies and parameter optimization.

Main Results:

  • EDXRD enables rapid data acquisition over a wide d-spacing range.
  • The technique is suitable for time-resolved, bulk-penetrating, and operando studies.
  • Applications in high-pressure and battery research are demonstrated.

Conclusions:

  • EDXRD offers significant advantages for dynamic and in-situ material characterization.
  • Future prospects include advanced detector technology and machine learning for spectral analysis.
  • Standardization and automation of EDXRD systems are key development areas.