Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Focusing of Light in the Eye

Focusing of Light in the Eye

Light rays enter the eye through the cornea, a transparent dome-shaped tissue that is the eye's outermost layer. The cornea bends or refracts, light rays traveling to the pupil. The shape of the cornea determines how much of the light is bent and whether the image will be focused correctly on the retina at the back of the eye. Once the light has passed through both refraction layers, it converges into a single focal point onto a small area. This is where photoreceptors start transforming...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Bile acid metabolomics reveals distinct immunometabolic niches and enables accurate diagnosis of AQP4-IgG-seronegative NMOSD.

Frontiers in immunology·2026

Same author

Integrated metabolomics analysis identifies distinct amino acid signatures in chronic hepatitis B patients with metabolic dysfunction-associated steatotic liver disease.

Frontiers in cellular and infection microbiology·2026

Same author

[Analysis of the Advantages and Clinical Validation of Real-Time Fluorescence Nucleic Acid Isothermal Amplification Detection Technology in Detecting Low Viral Load Samples From HBV-Infected Patients].

Sichuan da xue xue bao. Yi xue ban = Journal of Sichuan University. Medical science edition·2026

Same author

Lactylation-related gene signature for prognosis prediction and immune infiltration assessment in lung adenocarcinoma via bulk and single-cell RNA sequencing.

Discover oncology·2026

Same author

The MADS-box gene CmAP1 promotes flowering and petal development in Chinese chestnut (Castanea mollissima).

BMC plant biology·2025

Same author

A novel therapy targeting the gut-liver axis for chronic hepatitis B: Ursodeoxycholic acid plus <i>Bifidobacterium</i>.

JHEP reports : innovation in hepatology·2025

Same journal

Correction: Kang et al. Fluid Flow to Electricity: Capturing Flow-Induced Vibrations with Micro-Electromechanical-System-Based Piezoelectric Energy Harvester. <i>Micromachines</i> 2024, <i>15</i>, 581.

Micromachines·2026

Same journal

Femtosecond Laser Texturing of Wood Coatings with Bio-Based Epoxy and Wax Additives for Enhanced Hydrophobicity.

Micromachines·2026

Same journal

Engineering of Optoelectronic Devices for Renewable Energy Applications.

Micromachines·2026

Same journal

Phase Transformation and Electrochemical Behavior of Hexagonal TiO<sub>2</sub> Nanotubes Under Different Annealing Temperatures and Heating Rates.

Micromachines·2026

Same journal

Process Optimization and Predictive Modeling of Femtosecond Laser Precision Milling for Commercial PMMA Slices.

Micromachines·2026

Same journal

A Hybrid Preprocessing Multi-Objective Surrogate Model for Thermal MEMS Actuators.

Micromachines·2026

See all related articles

Search research articles

Related Experiment Video

Updated: Feb 28, 2026

ODELAY: A Large-scale Method for Multi-parameter Quantification of Yeast Growth

ODELAY: A Large-scale Method for Multi-parameter Quantification of Yeast Growth

Published on: July 3, 2017

One Method for Improving Overlay Accuracy Through Focus Control.

Yanping Lan¹, Jingchao Qi¹, Mengxi Gui²

¹Shanghai Yuwei Semiconductor Technology Co., Ltd., Shanghai 201203, China.

|February 27, 2026

Summary

This summary is machine-generated.

This study introduces an integrated approach using dual-wavelength optics and deep learning for precise semiconductor overlay measurement. The method enhances both accuracy and efficiency in advanced process nodes.

Keywords:

IBO dual-wavelength optical focal plane measurement mark alignment overlay

More Related Videos

Evaluating Targeting Accuracy in the Focal Plane for an Ultrasound-guided High-intensity Focused Ultrasound Phased-array System

Evaluating Targeting Accuracy in the Focal Plane for an Ultrasound-guided High-intensity Focused Ultrasound Phased-array System

Published on: March 6, 2019

Gain-compensation Methodology for a Sinusoidal Scan of a Galvanometer Mirror in Proportional-Integral-Differential Control Using Pre-emphasis Techniques

Gain-compensation Methodology for a Sinusoidal Scan of a Galvanometer Mirror in Proportional-Integral-Differential Control Using Pre-emphasis Techniques

Published on: April 4, 2017

Related Experiment Videos

Last Updated: Feb 28, 2026

ODELAY: A Large-scale Method for Multi-parameter Quantification of Yeast Growth

ODELAY: A Large-scale Method for Multi-parameter Quantification of Yeast Growth

Published on: July 3, 2017

Evaluating Targeting Accuracy in the Focal Plane for an Ultrasound-guided High-intensity Focused Ultrasound Phased-array System

Evaluating Targeting Accuracy in the Focal Plane for an Ultrasound-guided High-intensity Focused Ultrasound Phased-array System

Published on: March 6, 2019

Gain-compensation Methodology for a Sinusoidal Scan of a Galvanometer Mirror in Proportional-Integral-Differential Control Using Pre-emphasis Techniques

Gain-compensation Methodology for a Sinusoidal Scan of a Galvanometer Mirror in Proportional-Integral-Differential Control Using Pre-emphasis Techniques

Published on: April 4, 2017

Area of Science:

Semiconductor Manufacturing
Optical Metrology
Image Processing

Background:

Overlay measurement accuracy is critical for semiconductor fabrication.
Focal plane detection significantly impacts overlay accuracy and measurement throughput.
Advanced process nodes demand improved accuracy and efficiency.

Purpose of the Study:

To develop an integrated optimization strategy for overlay measurement.
To address the trade-off between accuracy and efficiency in advanced process nodes.
To improve both accuracy and efficiency of overlay measurement.

Main Methods:

Implemented a dual-wavelength, dual-detector optical hardware architecture.
Selected independent optimal imaging wavelengths for different layers.
Employed a deep learning framework for real-time alignment and defocus prediction.
Utilized synergistic hardware and software strategies for optimal imaging posture.

Main Results:

Achieved ideal imaging conditions for each layer without interference.
Enabled simultaneous prediction and adjustment of horizontal position and defocus.
Effectively mitigated background noise and system aberrations.
Significantly improved both accuracy and efficiency of overlay measurement.

Conclusions:

The integrated optimization strategy enhances overlay measurement performance.
Dual-wavelength optics and deep learning synergize for superior results.
This method is crucial for meeting the demands of advanced semiconductor process nodes.