Recent Advances in Fault Diagnosis and Opacity Analysis in Discrete Event Systems
Agostino Marcello Mangini1, Ruotian Liu1, Wei Duan1
1Department of Electrical and Information Engineering (DEI), Polytechnic University of Bari, 70126 Bari, Italy.
Sensors (Basel, Switzerland)
|February 27, 2026
Summary
This survey details recent advances in fault diagnosis and opacity analysis for discrete event systems (DESs), covering challenges like communication losses and cyber-attacks. It reviews diagnosability and opacity verification and enforcement in modern DES research.
Area of Science:
- Control Theory
- Computer Science
- Systems Engineering
Background:
- Fault diagnosis and opacity analysis are critical for ensuring the reliability and security of discrete event systems (DESs).
- Previous work established foundational concepts in event diagnosis and opacity.
- Modern DES applications face increasing complexity and new challenges.
Purpose of the Study:
- To provide a comprehensive survey of recent advances in fault diagnosis and opacity analysis for DESs over the past decade.
- To address contemporary challenges including communication losses, delays, distributed architectures, and cyber-attack scenarios.
- To highlight emerging themes and open problems in the field.
Main Methods:
- Structured overview of diagnosability verification and enforcement across various DES models (automata, Petri nets).
- Review of contemporary results on opacity verification and enforcement.
- Analysis of complexity findings, reduction techniques, and robust/attack-resilient formulations.
Main Results:
- Detailed examination of diagnosability and opacity in DES under modern challenging conditions.
- Identification of key advancements in verification and enforcement techniques.
- Synthesis of the current research landscape and its evolution.
Conclusions:
- The field of DES diagnosis and opacity has seen significant progress in addressing complex, real-world challenges.
- There is a continuing need for research into robust and resilient solutions for fault detection and security.
- Emerging themes and open problems offer avenues for future research and development.
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