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Updated: Mar 1, 2026

Performing Spectroscopy on Plasmonic Nanoparticles with Transmission-Based Nomarski-Type Differential Interference Contrast Microscopy
Published on: June 5, 2019
Through-focus scanning polarized microscopy (TSPM) offers efficient nanoparticle characterization. This new method accurately estimates nanoparticle parameters using polarization-resolved images, benefiting material sciences and semiconductor industries.
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