Probing Thermal-Induced Strain at Atomic Interfaces via Raman Spectroscopy

Zixiu Cai1, Abhinav Biswas2, Xinyue Chen2

  • 1Department of Mechanical, Aerospace, and Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180, United States.

Summary

This study uses Raman spectroscopy to analyze thermal strain at interfaces between graphene and hexagonal boron nitride. Findings reveal temperature-induced strain significantly impacts interfacial thermal behavior in 2D materials.

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