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Array-Integrated Perovskite X-Ray Detectors: Advances, Challenges, and Perspectives.

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  • 1Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen, P. R. China.

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|March 4, 2026
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Summary

Perovskite materials are revolutionizing X-ray detection due to their excellent properties, enabling sensitive and high-resolution imaging. This review covers their fabrication, integration with thin-film transistor (TFT) and complementary metal oxide semiconductor (CMOS) arrays, and future potential.

Keywords:
CMOSTFTdirect integrationperovskite arraytransfer intergration

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Area of Science:

  • Materials Science
  • Detector Physics
  • Medical Imaging Technology

Background:

  • X-ray detection is crucial in medicine, industry, and security.
  • Perovskite materials offer superior X-ray attenuation and carrier properties.
  • Existing detectors face limitations in sensitivity and resolution.

Purpose of the Study:

  • To review the principles and metrics of X-ray detectors.
  • To survey large-area perovskite film and array fabrication.
  • To detail advancements in perovskite integration with TFT/CMOS arrays.

Main Methods:

  • Comprehensive literature review of perovskite X-ray detector research.
  • Analysis of fabrication techniques for perovskite films and arrays.
  • Focus on thin-film transistor (TFT) and complementary metal oxide semiconductor (CMOS) integration.

Main Results:

  • Perovskites enable high-sensitivity X-ray detectors with low detection limits.
  • Various large-area fabrication methods for perovskite films are discussed.
  • Progress in TFT/CMOS integrated perovskite X-ray detectors is highlighted.

Conclusions:

  • Perovskite X-ray detectors show significant promise for advanced imaging.
  • Challenges in practical integration and future development trends are addressed.
  • TFT/CMOS integration is key for array-based perovskite X-ray detectors.