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Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Fernando Teixeira Bueno1, Pedro Henrique de Oliveira Neto1,2, Leonardo Evaristo de Sousa3
1Institute of Physics, University of Brasilia, Brasilia-DF, 70910-900 DF, Brazil.
We developed a novel optical method to measure the static dielectric constant (ϵ) using donor-acceptor (DA) probes. This technique bypasses traditional capacitance measurements, enabling dielectric analysis in challenging thin films and biological samples.
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