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Updated: Mar 6, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
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Fernando Teixeira Bueno1, Pedro Henrique de Oliveira Neto1,2, Leonardo Evaristo de Sousa3

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Summary

We developed a novel optical method to measure the static dielectric constant (ϵ) using donor-acceptor (DA) probes. This technique bypasses traditional capacitance measurements, enabling dielectric analysis in challenging thin films and biological samples.

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Area of Science:

  • Materials Science
  • Spectroscopy
  • Biophysics

Background:

  • Quantifying the static dielectric constant (ϵ) is crucial for material and biological studies.
  • Capacitance-based measurements are limited in thin films and heterogeneous environments.
  • Optical methods offer a non-invasive alternative for dielectric property determination.

Purpose of the Study:

  • To present an entirely optical approach for determining the static dielectric constant (ϵ).
  • To enable dielectric measurements in challenging samples like thin films and biological systems.
  • To introduce a user-friendly software package for applying this methodology.

Main Methods:

  • Utilizing donor-acceptor (DA) probe molecules with charge-transfer (CT) states.
  • Analyzing fluorescence spectra and solvatochromic shifts in response to varying solvent polarity.
  • Parametrizing fluorescence energy using vacuum emission energy and solvatochromic susceptibility (χ).

Main Results:

  • Demonstrated that DA fluorophores' fluorescence energy correlates with solvent polarity.
  • Established a method to determine ϵ from optical spectra using DA probes.
  • Successfully applied the technique to organic thin films and live-cell environments.

Conclusions:

  • The optical method provides a noninvasive way to quantify static dielectric constants (ϵ).
  • This approach overcomes limitations of capacitance measurements in complex media.
  • The DA probe strategy offers a versatile tool for dielectric analysis across diverse scientific fields.