Correction: Unlocking the loading limit in single-atom photocatalysts via defect-induced metal trapping

Laihao Liu1, Yucong Huang1, Xiaocang Han2

  • 1Guangdong Basic Research Center of Excellence for Aggregate Science, School of Science and Engineering, The Chinese University of Hong Kong, Shenzhen, Guangdong, 518172, China. jingjxiong@cuhk.edu.cn.

Nanoscale
|March 5, 2026
PubMed
Summary

This correction clarifies how defects in single-atom photocatalysts enhance metal trapping, improving their loading capacity. This advancement is crucial for optimizing photocatalyst performance.