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Modeling of Au Migration and Analysis of Au-Doped HgCdTe Photodetectors
Dapeng Jin1,2,3, Zhikai Gan1, Songmin Zhou1
1National Key Laboratory of Infrared Detection Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 200083 Shanghai, China.
Abstract:
Investigation of diffusion coefficients and activation energies constitutes a fundamental aspect of dopant characterization studies. In this study, a diffusion model for Au incorporation in vacancy-doped HgCdTe has been established, investigating the temperature-dependent and Hg vacancy concentration-dependent diffusion behavior across different experimental conditions. This study further examined the correlation between the Au activation energy and HgCdTe composition. The fabricated very long wavelength infrared photodetectors exhibited characteristic Au-doped electrical properties, validating the implemented doping strategy. These findings provide essential guidance for optimizing the Au doping process and establishing activation energy parameters with varying HgCdTe compositions.

