Enhancing Accuracy and Interfacial Adhesion in PEEK-Based Conformal Electronics Fabricated via Hybrid Additive
Pan Chen1, Lizhi Jiang1, Li Meng1
1Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074, China.
ACS Applied Materials & Interfaces
|March 10, 2026
Summary
This study enhances polyetheretherketone (PEEK)-based conformal electronics fabrication using fused deposition modeling (FDM) and laser-activated metallization (LAM). Optimized methods significantly improve pattern accuracy and interfacial adhesion for high-performance 3D electronics.
Area of Science:
- Materials Science and Engineering
- Additive Manufacturing
- Surface Chemistry
Background:
- Hybrid additive manufacturing, combining FDM and LAM, is crucial for 3D conformal electronics.
- Existing methods face challenges in pattern accuracy and interfacial bonding strength.
- Polyetheretherketone (PEEK) is a key material for conformal electronics fabrication.
Purpose of the Study:
- To address poor pattern accuracy and low interfacial bonding strength in PEEK-based conformal electronics.
- To investigate precursor decomposition mechanisms under laser irradiation.
- To develop dual optimization strategies for enhanced fabrication.
Main Methods:
- Comparative study of precursor decomposition (Pd(OAc)2 vs. PdCl2) under UV picosecond laser irradiation.
- Improved LAM with directional gas flow-assisted laser activation and solvent optimization.
- DMAc cleaning and KH550 silane coupling agent grafting for interfacial enhancement.
Main Results:
- Pd(OAc)2 showed more efficient decomposition, enhancing copper deposition.
- High-precision copper lines (50 μm width, 60 μm spacing) achieved via optimized LAM.
- Interfacial adhesion strength increased from 3.3 to 29.4 MPa through dual reinforcement (mechanical interlocking and chemical bonding).
Conclusions:
- Dual optimization strategies significantly improve PEEK-based conformal electronics fabrication.
- Achieved high pattern accuracy and dramatically enhanced PEEK-Cu interfacial adhesion.
- Validated performance through complex circuit fabrication and antenna testing, advancing applications.


