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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Alex L Melendez1, Ruotian Gong2, Guanghui He2
1Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Researchers used nitrogen-vacancy (NV) centers to indirectly detect and map spin defects in 2D materials. This novel technique enables nanoscale characterization of quantum sensors without optical detection.
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