2D-RIXS: resonant inelastic X-ray scattering microscopy with high energy and spatial resolutions

Area of Science:

• Materials Science
• Condensed Matter Physics
• Spectroscopy

Background:

• Advanced microscopy techniques are crucial for characterizing quantum materials.
• Resonant inelastic X-ray scattering (RIXS) provides insights into electronic excitations.
• Combining RIXS with microscopy enhances spatial analysis capabilities.

Purpose of the Study:

• To develop and demonstrate a two-dimensional resonant inelastic X-ray scattering (2D-RIXS) microscopy system.
• To achieve simultaneous micrometer spatial and ultrahigh energy resolution in soft X-ray spectroscopy.
• To establish 2D-RIXS microscopy as a tool for analyzing inhomogeneous quantum materials and devices.

Main Methods:

• Development of a 2D-RIXS microscopy system at beamline BL02U, NanoTerasu.
• Integration of a Wolter type-I mirror for spatial imaging.
• Utilization of a varied-line-spacing grating spectrometer for high energy resolution.

Main Results:

• Achieved a vertical spatial resolution of 1.0 µm and horizontal resolution of 0.8 µm.
• Demonstrated RIXS imaging of a patterned logo and NiPS3 nanoflakes.
• Confirmed the system's efficiency in locating microscale regions in inhomogeneous samples.

Conclusions:

• The developed 2D-RIXS microscopy system provides unprecedented spatial and energy resolution.
• This technique is effective for probing elementary excitations in quantum materials.
• It serves as a valuable position-sensitive probe for functional devices.