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Updated: Mar 12, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
2D-RIXS: resonant inelastic X-ray scattering microscopy with high energy and spatial resolutions
Kohei Yamamoto1, Hakuto Suzuki2, Jun Miyawaki1
1NanoTerasu Center, National Institutes for Quantum Science and Technology, 468-1 Aoba, Aramaki, Aoba-ku, Sendai, Miyagi 980-8572, Japan.
Abstract:
A two-dimensional resonant inelastic X-ray scattering (2D-RIXS) microscopy system has been developed at beamline BL02U of NanoTerasu. The instrument combines a Wolter type-I mirror for spatial imaging with a varied-line-spacing grating spectrometer, simultaneously achieving micrometre-scale spatial resolution and ultrahigh energy resolution in the soft X-ray regime. Test chart measurements confirm a vertical spatial resolution of 1.0 µm near the field-of-view center, and the horizontal resolution determined by the incident beam footprint is 0.8 µm. RIXS imaging capabilities have been demonstrated by the measurements of a patterned NanoTerasu logo and exfoliated NiPS3 nanoflakes, highlighting its efficiency in locating specific microscale regions within inhomogeneous samples. These results establish 2D-RIXS microscopy as a position-sensitive probe of elementary excitations in quantum materials and functional devices.
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