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High-Stable Electric Field Integrated Optical Sensor Based on Reduced Lithium Niobate.

Aleksei Sosunov1, Artem Shipitsin1,2, Mikhail Zhitkov1

  • 1Perm State University, 614990 Perm, Russia.

Sensors (Basel, Switzerland)
|March 14, 2026
PubMed
Summary
This summary is machine-generated.

Thermally reduced lithium niobate enhances the stability of integrated optical electric field sensors by mitigating the pyroelectric effect. This breakthrough promises more reliable optical devices for navigation and telecommunications.

Keywords:
Michelson interferometerdevice calibrationelectric field sensorsintegrated opticsoptical instabilitypyroelectric effectreduced lithium niobate

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Area of Science:

  • Photonics and Materials Science
  • Integrated Optics
  • Sensor Technology

Background:

  • Lithium niobate (LN) integrated optical devices are crucial for navigation, telecommunications, and sensing.
  • Their performance is limited by temperature-dependent instability due to the pyroelectric effect in LN.
  • This instability hinders long-term operational reliability.

Purpose of the Study:

  • To investigate thermally reduced lithium niobate (LN) as a stable material platform for integrated optical circuits.
  • To enhance the stability of integrated optical electric field sensors (IOES).
  • To address the limitations imposed by the pyroelectric effect in LN.

Main Methods:

  • Fabrication of an integrated optical electric field sensor (IOES) using a Michelson interferometer design.
  • Characterization of key performance metrics: optical loss, free spectral range, electro-optical sensitivity, and optical path difference.
  • Evaluation of device stability under applied voltage and assessment of calibration accuracy.

Main Results:

  • The IOES demonstrated exceptional optical path difference stability with no observable drift over time under normal climatic conditions (0-5 V applied voltage).
  • Device calibration showed a predominantly linear response, with a third-degree polynomial model offering a more precise fit.
  • A minimum relative error of 0.47% was achieved during calibration, indicating high device accuracy.

Conclusions:

  • Thermally reduced LN is a promising material for next-generation integrated optical devices, significantly improving long-term stability.
  • Mitigating the pyroelectric effect in LN enhances the reliability of IOES and other photonic components.
  • This approach enables the deployment of stable integrated optical systems in demanding, environmentally sensitive applications.