Related Experiment Video
Updated: Mar 19, 2026

07:37
Full-field Strain Measurements for Microstructurally Small Fatigue Crack Propagation Using Digital Image Correlation Method
Published on: January 16, 2019
10.2K
Development of internal defect detection equipment for composite materials based on shear speckle interference.
Applied Optics
|March 17, 2026
Summary
A portable device improves composite defect detection using advanced phase unwrapping for real-time analysis. This system achieves high accuracy and submillimeter resolution for aerospace nondestructive testing.
Area of Science:
- Materials Science
- Optical Engineering
- Nondestructive Testing
Background:
- Traditional composite defect detection systems suffer from slow phase-shifting speeds and limited hardware integration.
- Shear speckle interferometry is a powerful technique for defect detection but can be limited by processing speed and noise.
Purpose of the Study:
- To develop a portable, high-speed composite defect detection system overcoming traditional limitations.
- To improve real-time phase unwrapping algorithms for enhanced shear speckle interferometry measurements.
Main Methods:
- Integration of a Wollaston prism shearing module with a high-speed liquid crystal phase retarder.
- Development of an embedded GPU platform for accelerated processing.
- Implementation of a novel phase unwrapping algorithm combining gradient-adaptive smoothing and graph-cut optimization.
Main Results:
- The new algorithm reduced root mean square error (RMSE) by 27.34%–33.20% under hybrid noise conditions.
- Single-frame analysis was completed within 0.36 seconds.
- Achieved 97% accuracy in detecting internal defects (≥2mm diameter) in aluminum and composite specimens under heat loading.
Conclusions:
- The developed portable device offers high-speed, high-sensitivity nondestructive testing capabilities.
- The integrated hardware-software design provides submillimeter resolution and field-deployable portability.
- This system meets critical requirements for aerospace applications demanding efficient defect detection.

