Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Confocal Fluorescence Microscopy

Confocal Fluorescence Microscopy

Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Daratumumab plus VRd in Japanese transplant-ineligible/deferred NDMM patients: Japanese subgroup of the CEPHEUS trial.

International journal of hematology·2026

Same author

Dispersion-based interference fringe-order discrimination for long-range single-shot optical frequency comb interferometry.

Applied optics·2026

Same author

Direct Combinational Measurements of the Electron Density and Electric Field in Secondary Streamer Discharge under Atmospheric-Pressure Air.

Physical review letters·2026

Same author

The novel strategy to acute coronary syndrome with resistant massive thrombus.

Cardiovascular intervention and therapeutics·2025

Same author

Development of Notch-Free, Pre-Bent Rod Applicable for Posterior Corrective Surgery of Thoracolumbar/Lumbar Adolescent Idiopathic Scoliosis.

Journal of clinical medicine·2023

Same author

Efficient use of all ports of a 3 × 3 coupler in a nonlinear amplifying loop mirror-based fiber laser.

Optics letters·2023

Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026

Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026

Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026

Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026

Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026

Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026

See all related articles

Search research articles

Related Experiment Video

Updated: May 2, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Sample integrated laser for optical thickness measurement using single-shot interferometry.

Preangka Roy, Bao Dinh Thai, Yume Hashimoto

|March 17, 2026

Summary

This summary is machine-generated.

We developed a novel single-shot interferometry method to measure optical thickness in Fabry-Perot etalons. This technique integrates the etalon into a laser cavity, enhancing sensitivity for optical thickness measurements.

More Related Videos

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

Published on: August 12, 2013

Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

Related Experiment Videos

Last Updated: May 2, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

Published on: August 12, 2013

Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

Area of Science:

Optics and Photonics
Interferometry
Metrology

Background:

High-finesse Fabry-Perot etalons are crucial optical components.
Accurate measurement of their optical thickness is essential for device performance.
Conventional methods may face limitations in sensitivity and speed.

Purpose of the Study:

To present a novel single-shot interferometry method for measuring etalon optical thickness.
To demonstrate a new light source integrated with the etalon for improved sensitivity.
To compare the new method with conventional approaches.

Main Methods:

Integrating a sample etalon into a laser cavity to create a new light source.
Utilizing single-shot interferometry for rapid optical thickness measurement.
Comparing experimental results with the conventional single-shot technique.

Main Results:

A novel light source with a sweep time of 49 µs and a tuning range of ~1.65 THz was demonstrated.
The method successfully measured the optical thickness of a customized etalon.
The average optical thickness was measured as (7.0±0.1)×10² µm, validating the technique.

Conclusions:

The presented single-shot interferometry method offers an effective way to measure optical thickness.
Integrating the etalon into the laser cavity enhances measurement sensitivity.
This approach provides a faster and potentially more sensitive alternative to conventional methods.