Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Super-resolution Fluorescence Microscopy

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Deep learning approach for flow visualization in background-oriented schlieren.

Applied optics·2025

Same author

Robust method to process nonuniform intensity holograms in digital holographic microscopy for nanoscale surface metrology.

Applied optics·2023

Same author

Deep learning assisted non-contact defect identification method using diffraction phase microscopy.

Applied optics·2023

Same author

Quantitative phase gradient metrology using diffraction phase microscopy and deep learning.

Journal of the Optical Society of America. A, Optics, image science, and vision·2023

Same author

Multiple phase extraction using graphics processing unit assisted unitary transformation method in digital holographic interferometry.

Applied optics·2022

Same author

Phase derivative estimation in digital holographic interferometry using a deep learning approach.

Applied optics·2022

Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026

Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026

Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026

Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026

Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026

Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026

See all related articles

Search research articles

Related Experiment Video

Updated: Mar 19, 2026

The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight

The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight

Published on: October 11, 2016

Precision surface metrology using a rapid optimization method in diffraction phase microscopy.

Subrahmanya Keremane Narayan, Rajshekhar Gannavarpu

|March 17, 2026

Summary

This summary is machine-generated.

This study introduces a graphics processing unit-assisted technique to accurately retrieve phase from noisy interferograms. The method enhances computational speed and precision for nanoscale surface profile measurements.

More Related Videos

$X-ray Powder Diffraction in Conservation Science: Towards Routine Crystal Structure Determination of Corrosion Products on Heritage Art Objects$

X-ray Powder Diffraction in Conservation Science: Towards Routine Crystal Structure Determination of Corrosion Products on Heritage Art Objects

Published on: June 8, 2016

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

Related Experiment Videos

Last Updated: Mar 19, 2026

The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight

The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight

Published on: October 11, 2016

$X-ray Powder Diffraction in Conservation Science: Towards Routine Crystal Structure Determination of Corrosion Products on Heritage Art Objects$

X-ray Powder Diffraction in Conservation Science: Towards Routine Crystal Structure Determination of Corrosion Products on Heritage Art Objects

Published on: June 8, 2016

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

Area of Science:

Metrology and Optical Engineering
Computational Science

Background:

Optical interferometry is crucial for nanoscale surface profiling in precision metrology.
Accurate phase retrieval from interferograms is essential but challenged by noise and amplitude variations.
Existing methods often suffer from high computational costs and limited robustness.

Purpose of the Study:

To develop an efficient and robust phase retrieval technique for optical interferometry.
To address challenges posed by severe noise and non-uniform amplitude fluctuations in interferograms.
To improve computational speed and accuracy in nanoscale surface metrology.

Main Methods:

Implementation of a second-order optimization technique.
Leveraging graphics processing unit (GPU) acceleration for enhanced computation.
Demodulation of interferograms with simulated and experimental noise and amplitude variations.

Main Results:

The proposed GPU-assisted method demonstrates significant computational gain.
Robust phase estimation accuracy is achieved even with severe noise and amplitude fluctuations.
Successful application in nanoscale surface profile measurement using diffraction phase microscopy.

Conclusions:

The developed technique offers a powerful solution for processing noisy interferograms in optical metrology.
GPU acceleration significantly enhances the efficiency of phase retrieval algorithms.
The method provides a practical and accurate approach for nanoscale surface characterization.