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    Fourier ptychography (FP) generates high-resolution images using multiple low-resolution measurements. This new method uses sample tilt for diversity, simplifying the acquisition process and enabling advanced imaging without knowing the exact tilt angle.

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    Area of Science:

    • Optical imaging
    • Computational imaging
    • Microscopy

    Background:

    • Fourier ptychography (FP) reconstructs high-resolution images from low-resolution measurements.
    • Traditional FP methods require complex setups with changing illumination or camera positions.
    • These conventional approaches increase cost and complexity in optical imaging systems.

    Purpose of the Study:

    • To introduce a novel Fourier ptychography approach using sample tilt for measurement diversity.
    • To develop a learning-based method for estimating sample orientation from intensity measurements.
    • To enable synthetic aperture imaging without prior knowledge of the tilt angle.

    Main Methods:

    • Developed inverse synthetic aperture Fourier ptychography (ISAFP) by utilizing sample tilt for measurement diversity.
    • Introduced a novel learning-based algorithm to estimate sample orientation from dual plane intensity data.
    • Experimentally validated the ISAFP method through simulations and tabletop optical experiments.

    Main Results:

    • Demonstrated that sample tilt can effectively generate measurement diversity in FP.
    • Successfully reconstructed high-resolution images using ISAFP without explicit tilt angle information.
    • Validated the robustness and feasibility of the proposed learning-based orientation estimation.

    Conclusions:

    • ISAFP offers a simplified and cost-effective alternative to traditional FP acquisition methods.
    • The learning-based orientation estimation is crucial for enabling FP without explicit tilt angle knowledge.
    • This work advances synthetic aperture imaging techniques for broader applications in microscopy and optical sciences.