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Direct Imaging of Laser-driven Ultrafast Molecular Rotation

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Single-frame randomized probe imaging in the EUV using a high-order harmonic source.

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|March 18, 2026

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Area of Science:

Physics
Optics
Materials Science

Background:

High-resolution imaging is crucial for scientific advancements.
Extreme ultraviolet (EUV) light offers unique capabilities for nanoscale imaging.
Table-top high-harmonic generation (HHG) sources provide compact EUV generation.

Purpose of the Study:

To demonstrate single-frame randomized probe imaging (RPI) using a table-top EUV source.
To investigate the impact of different beam structures (smooth, vortex, speckle) on RPI resolution.
To assess the potential of RPI for rapid, high-resolution imaging applications.

Main Methods:

Utilized a 13.5 nm EUV beam from a table-top HHG source.
Employed single-frame RPI with smooth, vortex, and speckle illumination patterns.
Performed comparative analysis with ptychography reconstructions.
Investigated resolution enhancement through averaging multiple RPI frames.

Main Results:

Achieved single-frame RPI reconstructions for all tested beam types.
Obtained a highest resolution of 110 nm using the EUV speckle beam.
Demonstrated improved convergence and image fidelity with structured illuminations compared to a smooth beam.
Enhanced resolution to sub-100 nm by averaging RPI images.

Conclusions:

Single-frame RPI is a viable technique for rapid, high-resolution EUV imaging.
Structured illuminations, particularly speckle beams, enhance RPI performance.
RPI shows promise for applications requiring fast imaging, such as ultrafast pump-probe studies and real-time feedback.