Single-shot imaging with randomized structured illumination at a free electron laser.

Area of Science:

• Physics
• Materials Science
• Nanotechnology

Background:

• Free electron lasers (FELs) provide X-ray and extreme ultraviolet (XUV) radiation for nanoscale imaging.
• Understanding fast dynamics in heterogeneous systems requires high-resolution imaging techniques.

Purpose of the Study:

• To implement and demonstrate randomized probe imaging (RPI) at a free electron laser.
• To achieve nanoscale resolution imaging of extended and strongly scattering samples.

Main Methods:

• Utilized a free electron laser source for stroboscopic nanoscale imaging.
• Applied the randomized probe imaging technique for single-shot reconstructions.
• Employed circular dichroism at resonance for magnetic imaging.

Main Results:

• Achieved robust single-shot reconstructions with 400 nm resolution over a 40 µm field of view.
• Demonstrated single-shot imaging of magnetic domain structures.
• Validated RPI's compatibility with extended and strongly scattering samples.

Conclusions:

• Randomized probe imaging at FELs is a powerful tool for nanoscale imaging of complex systems.
• This technique opens new avenues for time-resolved studies in magnetism, shock physics, and electronic phase dynamics.