Photoluminescence: Applications
Photoluminescence: Fluorescence and Phosphorescence
Ultraviolet and Visible (UV–Vis) Spectroscopy: Overview
UV–Vis Spectrometers
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Updated: Mar 27, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Yi Hu1, Yi Wang1, Hengwei Lin1
1International Joint Research Center for Photo-Responsive Molecules and Materials, School of Chemical and Material Engineering, Jiangnan University, 214122 Wuxi, China.
Researchers developed a novel UV-visible dual-band persistent luminescent material using defect-assisted dopant engineering. This breakthrough enables simultaneous ultraviolet and visible afterglow for advanced optical information technologies.
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