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Updated: Mar 28, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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A lightweight metallographic defect detection framework via structured priors and energy-aware attention under strong

Zhi Shen1, Qigui Deng2, Zhongyi Wu3

  • 1Jiangxi Provincial Key Laboratory of Precision Drive and Equipment, Jiangxi University of Water Resources and Electric Power, Nanchang, 330099, China. nitshen2024@163.com.

Scientific Reports
|March 27, 2026
PubMed
Abstract

No abstract available in PubMed .

Keywords:
AISI 1020 steelDeep learningDefect detectionMetallographic analysisYOLOv10

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