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Published on: August 12, 2013
Reconstruction of Misalignment Aberrations for Cylindrical Surfaces with Complex Parameters in Pseudo Lateral
Yuxuan Ren1,2, Weizhou Luo2, Yang Chen2
1State Key Laboratory of Precision Measuring Technology & Instruments, Laboratory of Micro/Nano Manufacturing Technology, Tianjin University, Tianjin 300072, China.
This study introduces a new non-null testing method for complex cylindrical surfaces, effectively reconstructing misalignment aberrations and achieving high-precision surface recovery with excellent repeatability.
Area of Science:
- Optical metrology
- Aspheric optics measurement
- Interferometry
Background:
- High-precision measurement of cylindrical surfaces with complex parameters (CSCPs) is crucial in optical metrology.
- Traditional two-dimensional pseudo lateral shearing interferometry (2DPLSI) for CSCPs suffers from misalignment aberrations due to non-rotational symmetry, degrading reconstruction accuracy.
Purpose of the Study:
- To develop a novel non-null testing method for CSCPs that overcomes the limitations of existing 2DPLSI techniques.
- To accurately reconstruct CSCPs by eliminating misalignment aberrations and improving measurement precision.
Main Methods:
- A novel non-null testing method involving translation of the cylindrical surface in orthogonal directions for shearing.
- Elimination of wavefront errors through second-order differencing.
- A reconstruction algorithm utilizing the partial derivative in the x-direction to recover wavefront errors of misalignment aberrations.
Main Results:
- The proposed method effectively reconstructs misalignment aberrations in CSCPs.
- Achieved a reconstructed cylindrical surface with a peak-to-valley (PV) of 0.45λ and root-mean-square (RMS) of 0.12λ.
- Demonstrated superior repeatability (better than λ/1000 RMS) compared to existing methods.
Conclusions:
- The novel non-null testing method enables high-precision recovery of complex cylindrical surfaces.
- The technique effectively addresses and corrects misalignment aberrations, offering comparable accuracy to null testing.
- The method shows significant potential for advanced optical metrology applications.
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