Electrodeposition
Biasing of Metal-Semiconductor Junctions
Electrochemical Systems
Metal-Semiconductor Junctions
Properties of Transition Metals
Processes at Electrodes
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Using Laser Scanning Microscopy to Determine Electromigration in Molybdenum Disilicide
Published on: May 23, 2025
Vanessa Conti1, Cyrille Masserey1, Victor Boureau2
1Nanoelectronic Devices Laboratory (NanoLab), Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne 1015, Switzerland.
Electroforming in vanadium dioxide (VO2) thin films causes significant structural changes, altering device parameters. Controlled conditioning can improve VO2 memristor stability and reduce switching variability.
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