Preparation of Samples for Electron Microscopy
Cryo-electron Microscopy
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Updated: Jun 29, 2026

Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
Published on: July 26, 2014
Kil-Byoung Chai1,2, Eun-Beom Choi3, Hyo-Chang Lee3
1Nuclear Physics Application Research Division, Korea Atomic Energy Research Institute, Daejoen 34057, Republic of Korea.
A novel cryogenic etching device uses liquid nitrogen conductive cooling for precise temperature control down to -170°C. This innovation offers a reliable, simple, and safe alternative for advanced cryogenic etching applications.
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11:03Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
Published on: July 14, 2022
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