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Published on: October 23, 2018
Development of electron source feedback for enhanced X-ray beam stability at NSLS-II
Sukho Kongtawong1, Yoshiteru Hidaka1, Hanfei Yan1
1National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, USA.
Journal of Synchrotron Radiation
|April 2, 2026
Summary
Future X-ray microscopy needs stable beams. This study uses the electron beam for feedback, successfully reducing vibrations and improving imaging quality for next-generation synchrotron light sources.
Area of Science:
- Synchrotron radiation science
- X-ray microscopy
- Accelerator physics
Background:
- Next-generation synchrotron light sources demand enhanced X-ray beam stability for advanced imaging.
- Existing mechanical feedback systems offer limited suppression of dominant vibrations (27 Hz, 120 Hz) at the Hard X-ray Nanoprobe (HXN) beamline.
- Vibrations degrade measurement accuracy and X-ray image quality.
Purpose of the Study:
- To investigate the electron beam as an active actuator for vibration feedback control.
- To enhance X-ray beam stability at the focusing point.
- To assess the effectiveness of electron-beam-based feedback for fast-scanning microscopy.
Main Methods:
- Integration of X-ray beam position monitor signals into the fast orbit feedback system.
- Utilizing a dedicated electrometer for signal processing.
- Implementing electron beam as the feedback actuator.
Main Results:
- Effective suppression of dominant vibration peaks at 27 Hz and 120 Hz.
- Demonstrated enhancement of X-ray beam stability at the focusing point.
- Ptychography measurements showed reduced background fluctuations and mitigated vibration artifacts during fast scanning.
Conclusions:
- Electron-beam-based feedback is a feasible approach for stabilizing X-ray beams in next-generation synchrotrons.
- This method significantly improves stability and reduces artifacts in fast-scanning imaging.
- Provides an experimental foundation for implementing this technique in future light source applications.
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