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Updated: Apr 5, 2026

Measuring Magnetically-Tuned Ferroelectric Polarization in Liquid Crystals
Published on: August 15, 2018
Static magnetization switching in an artificial antiferromagnetic multilayer driven by a voltage-controlled magnetic
Hiroyasu Nakayama1,2, Takayuki Nozaki3, Toshiki Yamaji3
1National Institute of Advanced Industrial Science and Technology, Research Institute for Hybrid Functional Integration, Tsukuba, Japan. nakayama.hiroyasu@aist.go.jp.
Researchers developed a new static magnetization switching method using voltage-controlled magnetic anisotropy (VCMA) for ultralow-power spintronic devices. This overcomes limitations of dynamic switching, enabling reliable, low-power data writing in magnetic memory.
Area of Science:
- Spintronics
- Materials Science
- Electrical Engineering
Background:
- Voltage-controlled magnetic anisotropy (VCMA) offers low-power magnetization switching for spintronic devices.
- Conventional dynamic VCMA switching is sensitive to picosecond pulse width variations, hindering practical applications like magnetoresistive random-access memory (MRAM).
Purpose of the Study:
- To develop a robust, low-power magnetization switching method for spintronic devices.
- To overcome the pulse width sensitivity limitations of dynamic VCMA switching.
Main Methods:
- Exploited an artificial antiferromagnetic trilayer structure with interlayer exchange coupling.
- Applied bipolar voltages to the antiferromagnetic structure to induce static magnetization switching.
Main Results:
- Demonstrated repeatable bidirectional magnetization switching using VCMA.
- Achieved static switching over a wide range of pulse widths, unlike sensitive dynamic switching.
- Overcame the picosecond-level pulse width sensitivity that plagues conventional methods.
Conclusions:
- VCMA-driven static magnetization switching is a viable and robust alternative to dynamic switching.
- This novel method is crucial for developing ultralow-power spintronic devices, including MRAM.
- The technique offers enhanced reliability and wider operational parameters for future memory technologies.
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