Imperfections in Crystal Structure: Point, Line and Plane Defects
Imperfections in Crystal Structure: Non-Stoichiometric Defects
Imperfections in Crystal Structure: Stoichiometric Point Defects
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Updated: Apr 11, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Arkady V Krasheninnikov1, Matthias Batzill1, Anouar-Akacha Delenda1
1For addresses of all authors, please see the end of the main text.
Defects in two-dimensional (2D) materials significantly impact properties, but understanding their behavior and engineering them remains challenging. This work highlights current challenges and proposes solutions for advancing research in defective 2D systems.
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