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Hybrid physics-machine learning models for quantitative electron diffraction refinements.

Shreshth A Malik1, Tiarnan A S Doherty2,3, Benjamin Colmey4

  • 1OATML, Department of Computer Science, University of Oxford, Oxford, UK.

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|April 11, 2026
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Summary
This summary is machine-generated.

This study introduces a hybrid physics-machine learning framework for electron microscopy simulations. It improves crystal structure refinement by learning experimental effects directly from data, achieving state-of-the-art results.

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Area of Science:

  • Materials Science
  • Computational Physics
  • Crystallography

Background:

  • Accurate electron microscopy simulations are crucial for crystal structure refinement.
  • Modeling real-world experimental effects analytically remains a significant challenge.
  • Existing methods struggle with scalability and accurately representing experimental variables.

Purpose of the Study:

  • To develop a novel hybrid physics-machine learning framework for electron microscopy simulations.
  • To enable joint optimization of physical parameters and experimental variables through differentiable simulations.
  • To enhance the accuracy and scalability of quantitative crystal structure refinements.

Main Methods:

  • Integration of differentiable physical simulations with neural networks.
  • Leveraging automatic differentiation for gradient-based optimization.
  • Application to three-dimensional electron diffraction (3D-ED) structure refinement.

Main Results:

  • Achieved state-of-the-art refinement performance on synthetic and experimental datasets.
  • Successfully recovered atomic positions, thermal displacements, and complex thickness profiles with high fidelity.
  • Demonstrated superior scalability compared to traditional second-order methods.

Conclusions:

  • Differentiable hybrid modeling is a powerful paradigm for quantitative electron microscopy.
  • The framework accurately models complex experimental effects, overcoming analytical limitations.
  • The modular architecture is extensible to other physical phenomena and microscopy techniques.