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Robust spatial phase prediction from paired intensities using multi-scale wavelets and aberration sensing network.

Yihang Huang1,2, Haitao Zhang1,2, Yao He1,2

  • 1State Key Laboratory of Precision Space-time Information Sensing Technology, Tsinghua University, Beijing 100084, China.

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Summary

This study introduces a novel method for spatial phase prediction using an aberration sensing convolutional neural network (ASCNN). The approach enhances aberration feature sequences (AFS) for improved accuracy in optical systems.

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Area of Science:

  • Optical Engineering
  • Computational Imaging
  • Machine Learning

Background:

  • Spatial phase prediction from intensity images is challenging due to compressed phase information and system variability.
  • Existing methods struggle with robustness, light intensity limits, and adaptability to different phase ranges.

Purpose of the Study:

  • To develop a robust and efficient method for spatial phase prediction from intensity images.
  • To create a feature map that accurately represents aberration characteristics.
  • To overcome limitations of existing phase prediction techniques.

Main Methods:

  • Utilized Fourier transform and multi-scale wavelet transform for feature mapping, creating an aberration feature sequence (AFS).
  • Developed a lightweight Aberration Sensing Convolutional Neural Network (ASCNN) for supervised learning and efficient computation.
  • Evaluated the method on scalar diffraction and polarized SLM systems.

Main Results:

  • The proposed AFS improved performance by approximately 30% compared to baseline features.
  • ASCNN achieved high accuracy in aberration retrieval, with RMSE better than 0.0143λ and SSIM exceeding 96%.
  • Demonstrated robustness and broad applicability across different optical systems.

Conclusions:

  • The ASCNN model, combined with AFS, offers a significant advancement in spatial phase prediction.
  • The method provides accurate and robust phase retrieval, overcoming previous limitations.
  • The approach shows strong potential for diverse applications in optical metrology and imaging.