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Novel single stage multipath 8 × 8 interconnection network/switching element (SSMIN/E) architecture.

Shilpa Gupta1, Madhu Bala2, Satish R Jondhale3

  • 1Department of Electronics and Communication Engineering, Chandigarh University, Mohali, Punjab, India.

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|April 17, 2026
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Summary
This summary is machine-generated.

This study introduces a novel 8x8 switching element (SE) with built-in path redundancy, enhancing fault tolerance in high-speed parallel computing. The new design offers improved reliability and reduced path length compared to traditional networks.

Keywords:
Fault ToleranceReliabilityShuffle Exchange Networks (SEN)Switching Elements (SEs), Single Stage Multipath Interconnection Network/Element (SSMIN/E), Gamma interconnection network (GIN)

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Area of Science:

  • Computer Science
  • Electrical Engineering
  • High-Performance Computing

Background:

  • Efficient interconnection networks are crucial for high-speed parallel computing performance.
  • Traditional 8x8 switching elements (SEs) lack path redundancy, creating single points of failure and reducing system reliability.
  • Existing Gamma networks offer scalability but are limited by single-path constraints within their SEs.

Purpose of the Study:

  • To propose a novel 8x8 full crossbar switching element (SE) with intrinsic path redundancy.
  • To enhance fault tolerance and reliability in interconnection networks for parallel computing systems.
  • To address the single-path limitation of traditional SEs and existing network structures.

Main Methods:

  • Designed a Single Stage Multipath Interconnection Network/Element (SSMIN/E) using four 3x3 SEs.
  • Implemented the 3x3 SEs with multiplexers and demultiplexers to create dual parallel paths.
  • Compared the reliability of the 8x8 SSMIN/E architecture with traditional shuffle exchange networks (SEN) and Gamma networks.

Main Results:

  • The proposed 8x8 SSMIN/E provides two parallel paths between each source-destination pair.
  • The new architecture demonstrates improved fault tolerance without increased routing complexity.
  • Comparative analysis shows the SSMIN/E offers enhanced reliability and reduced path length over SEN and Gamma networks.

Conclusions:

  • The novel 8x8 SSMIN/E architecture effectively incorporates structural redundancy for improved fault tolerance.
  • The developed switching element overcomes the single-path limitation of traditional designs.
  • The SSMIN/E presents a promising solution for reliable, fault-tolerant interconnects in high-performance computing applications.