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Published on: April 15, 2015
Novel single stage multipath 8 × 8 interconnection network/switching element (SSMIN/E) architecture.
Shilpa Gupta1, Madhu Bala2, Satish R Jondhale3
1Department of Electronics and Communication Engineering, Chandigarh University, Mohali, Punjab, India.
This study introduces a novel 8x8 switching element (SE) with built-in path redundancy, enhancing fault tolerance in high-speed parallel computing. The new design offers improved reliability and reduced path length compared to traditional networks.
Area of Science:
- Computer Science
- Electrical Engineering
- High-Performance Computing
Background:
- Efficient interconnection networks are crucial for high-speed parallel computing performance.
- Traditional 8x8 switching elements (SEs) lack path redundancy, creating single points of failure and reducing system reliability.
- Existing Gamma networks offer scalability but are limited by single-path constraints within their SEs.
Purpose of the Study:
- To propose a novel 8x8 full crossbar switching element (SE) with intrinsic path redundancy.
- To enhance fault tolerance and reliability in interconnection networks for parallel computing systems.
- To address the single-path limitation of traditional SEs and existing network structures.
Main Methods:
- Designed a Single Stage Multipath Interconnection Network/Element (SSMIN/E) using four 3x3 SEs.
- Implemented the 3x3 SEs with multiplexers and demultiplexers to create dual parallel paths.
- Compared the reliability of the 8x8 SSMIN/E architecture with traditional shuffle exchange networks (SEN) and Gamma networks.
Main Results:
- The proposed 8x8 SSMIN/E provides two parallel paths between each source-destination pair.
- The new architecture demonstrates improved fault tolerance without increased routing complexity.
- Comparative analysis shows the SSMIN/E offers enhanced reliability and reduced path length over SEN and Gamma networks.
Conclusions:
- The novel 8x8 SSMIN/E architecture effectively incorporates structural redundancy for improved fault tolerance.
- The developed switching element overcomes the single-path limitation of traditional designs.
- The SSMIN/E presents a promising solution for reliable, fault-tolerant interconnects in high-performance computing applications.
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