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Updated: Apr 22, 2026

07:38
Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on: April 18, 2019
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Numerical simulation of thickness-dependent carrier collection efficiency in SnSe absorber layers
R Ayyappa1, Radwa Marzouk2, Hatim Dafaalla3
1Department of Computer Science and Business Systems, E.G.S. Pillay Engineering College, Nagapattinam, Tamil Nadu, 611002, India. ayyappa@egspec.org.
Scientific Reports
|April 20, 2026
Summary
No abstract available in PubMed .
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